Researchers have developed a new method that makes X-ray images even better: The resolution is higher and allows more precise inferences about the properties of materials. They moved the lens of an X-ray microscope and recorded a number of individual images to generate, with the help of computer algorithms, the actual picture. They have, for the first time ever, transferred the principle of so-called Fourier ptychography to X-ray measurements.
from Latest Science News -- ScienceDaily http://bit.ly/2UwoZeV
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